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Amber Precision Instruments is a research-oriented EMC solution provider and EMC scanner manufacturer.

An Effective Method of Probe-calibration in Phase Resolved Near-field Scanning for EMI Application

Ji Zhang, Keong Kam, Jin Min, Victor Khilkevich, David Pommerenke, and Jun Fan, Senior Member, IEEE

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Application of Emission Source Microscopy Technique to EMI Source Localization above 5 GHz

Pratik Maheshwari, Victor Khilkevich, David Pommerenke, Missouri University of Science and Technology
Hamed Kajbaf, Jin Min, Amber Precision Instruments

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Application and Limits of IC and PCB Scanning Methods for Immunity Analysis

David Pommerenke, Giorgi Muchaidze, Jayong Koo, Qing Cai, University Missouri Rolla, EMC laboratory
Jin Min, Amber Precision Instruments

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A Measurement Technique for ESD Current Spreading on A PCB using Near Field Scanning

Wei Huang, David Pommerenke, Jiang Xiao, Dazhao Liu, EMC laboratory, Missouri Science and Technology
Jin Min, Giorgi Muchaidze, Amber Precision Instruments
Soonjae Kwon, Ki Hyuk Kim, Telecommunication R&D Center Advanced CAE Lab, Samsung Electronics

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Automated Near-Field Scanning to Identify Resonances

Muchaidze, Giorgi, Jin Min, Amber Precision Instruments
Huang Wei, Shao Peng, Jim Drewniak and David Pommerenke, Missouri Science and Technology

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EMI mitigation with lossy material at 10 GHz

Xiangyang Jiao, Pratik Maheshwari, Victor Khikevich, Paul Dixon, Yoeri Arien, Alpesh Bhobe, Jing Li, Xiao Li, David Pommerenke, James Drewniak, Hamed Kajbaf, Jin Min

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Far-Field Prediction Using Only Magnetic Near-Field Scanning for EMI Test_v5

Xu Gao, Jun Fan, Yaojiang Zhang, David Pommerenke, Senior Member, IEEE, Hamed Kajbaf, Member, IEEE

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Frequency-Domain Measurement Method for the Analysis of ESD Generators and Coupling

Jayong Koo, Qing Cai, Giorgi Muchaidze, Andy Martwick, KaiWang, and David Pommerenke, Senior Member, IEEE

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Modeling Electromagnetic Field Coupling form an ESD Gun to an IC

Ji Zhang, Daryl G Beetner, David Pommerenke, EMC Laboratory, Missouri University of Science and Technology
Richard Moseley, Scott Herrin, Freescale Semiconductor, Inc.

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Near Field Probe for Detecting Resonances in EMC Application

Jiang Xiao, Dazhao Liu, David Pommerenke, Wei Huang, Peng Shao, Xiang Li, EMC Lab, Missouri University of Science and Technology
Jin Min, Giorgi Muchaidze, Amber Precision Instruments

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Numerical Evaluation of Near-Field to Far-Field Transformation Robustness for EMC

Andriy Radchenko, Ji Zhang, Keong Kam, David Pommerenke, EMC Lab, Missouri University of Science and Technology

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Probe Characterization and Data Process for Current Reconstruction by Near Field Scanning Method

Wei Huang, Dazhao Liu, Jiang Xiao, David Pommerenke, EMC Laboratory, Missouri University of Science and Technology
Jin Min, Giorgi Muchaidze, Amber Precision Instruments

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Finding the Root Cause of an ESD Upset Event

David Pommerenke, University Missouri Rolla, Jayong Koo, and Giorgi Muchaidze

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Susceptibility Scanning as a Failure Analysis Tool for System-Level Electrostatic Discharge (ESD) Problems

Giorgi Muchaidze, Jayong Koo, Qing Cai, Tun Li, Lijun Han, Andrew Martwick, Kai Wang, Jin Min, James L. Drewniak, Fellow, IEEE, and David Pommerenke, Senior Member, IEEE

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