Technologies > Emission > ESM Scan
Amber Precision Instruments is a research-oriented EMC solution provider
Emission/ESM Scan > Principles
The fundamental concept of ESM (Emission Source Microscopy) is application of SAR (Synthetic Aperture Radar) technology to EMC. Fields are scanned in non-reactive near field region (2~3 lambda away from the source), where most evanescent waves died out, processed in k-space for efficiency with the captured phase information, and focused to the DUT surface height to identify propagating wave sources. The spatial resolution is limited by Abbe-Diffraction-Limit from optics, and the higher frequencies, the finer the spatial resolution. For more information, please, click on to view the paper.
• See the video of 'Emission Sources Microscopy Scanning System Principles' >
Spatial Resolution R = λ / (2*N.A.), where N.A. is given by n*sin(θ), n is the refractive index of the medium.
Emission/ESM Scan > Applications
● Far Field emission source localization
● NF to FF transformation
● TRP calculation
Emission/ESM Scan > Required Equipment
● Waveguides(or antennas)
● RF amplifiers
Waveguides (or antennas)
API provides two open-ended waveguides with horn antenna for X-band. And the user can prepare waveguides for other bands. There is no software limitation by measured frequencies as long as hardware supports.