• EMC/EMS Evaluation Platform and Solution Provider

Technologies > Immunity

API is a research-oriented EMC solution provider and EMC scanner manufacturer.


Various types of disturbances are injected to the DUT, and the responses are observed and recorded at every injection point. The disturbances can be magnetic or electric fields that cause fluctuations in voltage or current in the net, respective, or direct injection of currents. API's immunity scan technologies provide troubleshooting for ESD failures, a means to screen out problematic components for standard immunity tests, and a deeper understanding of EMC behavior of the DUT.

ESD Scan:

Electric and magnetic fields that are generated by currents during gun tests couple to the circuitry of electronics and cause frequent soft failures, and in some extreme cases, hard failures. The ESD scan emulates the coupling process by locally injecting electric or magnetic fields to a DUT.
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CS (Current Spreading) Scan:

CS is a reconstruction of spreading currents, which are usually the real problematic element that cause ESD failures. Magnetic fields are measured in time domain while currents are injected to a fixed point of a DUT. The currents are then converted to surface current density through post-measurement processing, and finally, the current flow is presented as a video.
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Robotic ESD Test:

The methodology for system level ESD testing is in accordance with the IEC 61000-4-2 standard. This standard sets minimal requirements and gives information on the test setup. The standard setting body had hand testing in mind, but did not include robotic testing. Because hand testing was in mind, many minimal parameters have been set such that repeatability problems result.
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RF Immunity:

This scanning technology is mainly to identify the sensitivity of a product to external or internal RF fields (for example, a cell phone disturbs a display) and the cause of the coupling. The scanning variables can be scan frequency, the modulation in the RF, the probe (electrical vs magnetic field, size, orientation), etc.
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