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Amber Precision Instruments is a research-oriented EMC solution provider and EMC scanner manufacturer.
An Effective Method of Probe-calibration in Phase Resolved Near-field Scanning for EMI Application
Ji Zhang, Keong Kam, Jin Min, Victor Khilkevich, David Pommerenke, and Jun Fan, Senior Member, IEEE
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Analysis of the Effect on Image Quality of Different Scanning Point Selection Methods in Sparse ESM
Morten Sorensen, Hamed Kajbaf, Victor Khilkevich, Ling Zhang, David Pommerenke
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Application of Emission Source Microscopy Technique to EMI Source Localization above 5 GHz
Pratik Maheshwari, Victor Khilkevich, David Pommerenke, Missouri University of Science and Technology
Hamed Kajbaf, Jin Min, Amber Precision Instruments
Application and Limits of IC and PCB Scanning Methods for Immunity Analysis
David Pommerenke, Giorgi Muchaidze, Jayong Koo, Qing Cai, University Missouri Rolla, EMC laboratory
Jin Min, Amber Precision Instruments
A Measurement Technique for ESD Current Spreading on A PCB using Near Field Scanning
Wei Huang, David Pommerenke, Jiang Xiao, Dazhao Liu, EMC laboratory, Missouri Science and Technology
Jin Min, Giorgi Muchaidze, Amber Precision Instruments
Soonjae Kwon, Ki Hyuk Kim, Telecommunication R&D Center Advanced CAE Lab, Samsung Electronics
Automated Near-Field Scanning to Identify Resonances
Muchaidze, Giorgi, Jin Min, Amber Precision Instruments
Huang Wei, Shao Peng, Jim Drewniak and David Pommerenke, Missouri Science and Technology
Broadband Phase Resolving Spectrum Analyzer Measurement for EMI Scanning Applications
Zongyi Chen, Shubhankar Marathe, Hamed Kajbaf, Stephan Frei, David Pommerenke
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Characterization of Human Metal Model ESD Based on Radiated Susceptibility
Hamed Kajbaf and Jin Min
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Design of TEM Transmission Line for Probe Calibration up to 40 GHz
Morten Sorensen, Shubankar Marathe, David Pommerenke, Hamed Kajbaf, Jin Min
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Effect of Inhomogeneous Medium on Fields above GCPW PCB for NearField Probe Calibration
Shubankar Marathe, Hamed Kajbaf, Morten Sorensen, Victor Khikevich, David Pommerenke, Jin Min, Giorgi Muchaidze
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Emission Source Microscopy Technique for EMI Source Localization
Pratik Maheshwari, Hamed Kajbaf, Victor V. Khilkevich, and David Pommerenke
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EMI mitigation with lossy material at 10 GHz
Xiangyang Jiao, Pratik Maheshwari, Victor Khikevich, Paul Dixon, Yoeri Arien, Alpesh Bhobe, Jing Li, Xiao Li, David Pommerenke, James Drewniak, Hamed Kajbaf, Jin Min
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Far-Field Prediction Using Only Magnetic Near-Field Scanning for EMI Test_v5
Xu Gao, Jun Fan, Yaojiang Zhang, David Pommerenke, Senior Member, IEEE, Hamed Kajbaf, Member, IEEE
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Finding the Root Cause of an ESD Upset Event
David Pommerenke, University Missouri Rolla, Jayong Koo, and Giorgi Muchaidze
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Frequency-Domain Measurement Method for the Analysis of ESD Generators and Coupling
Jayong Koo, Qing Cai, Giorgi Muchaidze, Andy Martwick, KaiWang, and David Pommerenke, Senior Member, IEEE
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Modeling Electromagnetic Field Coupling form an ESD Gun to an IC
Ji Zhang, Daryl G Beetner, David Pommerenke, EMC Laboratory, Missouri University of Science and Technology
Richard Moseley, Scott Herrin, Freescale Semiconductor, Inc.
Near Field Probe for Detecting Resonances in EMC Application
Jiang Xiao, Dazhao Liu, David Pommerenke, Wei Huang, Peng Shao, Xiang Li, EMC Lab, Missouri University of Science and Technology
Jin Min, Giorgi Muchaidze, Amber Precision Instruments
Numerical Evaluation of Near-Field to Far-Field Transformation Robustness for EMC
Andriy Radchenko, Ji Zhang, Keong Kam, David Pommerenke, EMC Lab, Missouri University of Science and Technology
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Probe Characterization and Data Process for Current Reconstruction by Near Field Scanning Method
Wei Huang, Dazhao Liu, Jiang Xiao, David Pommerenke, EMC Laboratory, Missouri University of Science and Technology
Jin Min, Giorgi Muchaidze, Amber Precision Instruments
Spectrum Analyzer Based Phase Measurement for Near-Field EMI Scanning
Shubhankar Marathe, Student Member, IEEE, Zongyi Chen, Kaustav Ghosh, Student Member, IEEE, Hamed Kajbaf, Senior Member, IEEE,
Stephan Frei, Senior Member, IEEE, Morten Sorensen, Member, IEEE, David Pommerenke, Fellow, IEEE, and Jin Min
Susceptibility Scanning as a Failure Analysis Tool for System-Level Electrostatic Discharge (ESD) Problems
Giorgi Muchaidze, Jayong Koo, Qing Cai, Tun Li, Lijun Han, Andrew Martwick, Kai Wang, Jin Min, James L. Drewniak, Fellow, IEEE, and David Pommerenke, Senior Member, IEEE
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